Vol. 1 Issue 1
Year:2013
Issue:Mar-May
Title:Fundamentals of Digital system Design using VHDL & DSCH3
Author Name:G. Ramachandran, G. Sureshkumar, B. Rajasekaran, M.S. Karthika, K. Jayaram and S. Kalavani
Synopsis:
A set of test vectors that detects all single stuck-at faults on all primary inputs of a fanout free combinational logic circuit will detect all single stuck –at faults in that circuit . A set of test vectors that detect all single stuck-at faults on all primary inputs and all fanout branches of a combinational logic circuit will detect all single stuck-at faults in that circuit. Design of logic integrated circuits in CMOS technology is becoming more and more complex since VLSI is the interest of many electronic IC users and manufactures . A common problem to be solved by designers, manufactures and users is the testing of these Ics. Testing can be expressed by checking if the outputs of a function systems (functional block, integrated circuits , printed circuit board or a complete systems) correspond to the inputs applied to it . If the test of this function system is positive , then the system is good for use. If the outputs are different than expected. Then the system has a problem : so either the system is rejected (go/no go test) , or a diagnosis is applied to it , in order to point out and probably eliminate the problem’s causes.
Year:2013
Issue:Mar-May
Title:Fundamentals of Digital system Design using VHDL & DSCH3
Author Name:G. Ramachandran, G. Sureshkumar, B. Rajasekaran, M.S. Karthika, K. Jayaram and S. Kalavani
Synopsis:
A set of test vectors that detects all single stuck-at faults on all primary inputs of a fanout free combinational logic circuit will detect all single stuck –at faults in that circuit . A set of test vectors that detect all single stuck-at faults on all primary inputs and all fanout branches of a combinational logic circuit will detect all single stuck-at faults in that circuit. Design of logic integrated circuits in CMOS technology is becoming more and more complex since VLSI is the interest of many electronic IC users and manufactures . A common problem to be solved by designers, manufactures and users is the testing of these Ics. Testing can be expressed by checking if the outputs of a function systems (functional block, integrated circuits , printed circuit board or a complete systems) correspond to the inputs applied to it . If the test of this function system is positive , then the system is good for use. If the outputs are different than expected. Then the system has a problem : so either the system is rejected (go/no go test) , or a diagnosis is applied to it , in order to point out and probably eliminate the problem’s causes.
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